Predictive Quality in Electronics Manufacturing - Industrial Data ...

Page created by Valerie Hines
 
CONTINUE READING
Predictive Quality in Electronics Manufacturing - Industrial Data ...
Predictive Quality in
   Electronics
   Manufacturing
   Unrestricted © Siemens AG 2019   www.siemens.com

Unrestricted © Siemens AG 2019
Predictive Quality in Electronics Manufacturing - Industrial Data ...
Siemens corporate structure

                                                                                Managing Board

                             Corporate Services                                      Regions                                     Corporate Core

             Power              Energy            Building           Mobility     Digital           Process       Siemens        Siemens           Financial
             and Gas            Management        Technologies                    Factory           Industries    Healthineers   Gamesa            Services
Divisions

                                                                                                    and Drives                   Renewable
                                                                                                                                 Energy
             Power
             Generation
             Services

                                  Factory                 Control               Product Lifecycle       Motion               Customer
                                  Automation              Products              Management              Control              Services

            Unrestricted © Siemens AG 2019
            Page 2                                                                                                                 Dr. Jochen Bönig | DF FA MF OPS&C
Predictive Quality in Electronics Manufacturing - Industrial Data ...
Excellence in manufacturing – For our customers

     Our Mission                                        Our Locations
 „
   Be the Role Model for Excellence in Manufacturing
  to provide proven Value Add for our Customers and
                                             „
  Business Unit, based on the methods of Digital
  Enterprise and Lean Industrial Engineering

  Shape the Digital Future. Together.
                                                                              (Karlsruhe)
                                 Dr. Gunter Beitinger
  Dr. Gunter Beitinger, Vice President                            (Lebanon)
  Manufacturing               VP of Manufacturing                                           Amberg

                                                                               Fürth                               Chengdu
                                                                                                                        (Nanjing)

Unrestricted © Siemens AG 2019
Page 3                                                                                               Dr. Jochen Bönig | DF FA MF OPS&C
Predictive Quality in Electronics Manufacturing - Industrial Data ...
Advanced data analytics as a key enabler to optimize our
processes

                                                                                                            How can we make
                                                                                                           something happen?

                                                                                                            Prescriptive
                                                                                                             Analytics
                                                                                       What will happen?
„Predictive Analytics
uses Big Data to                                                                        Predictive
analyze past patterns                                           Why did it happen?      Analytics                            Act

and predict the future“               Value    What happened?
                                                                 Diagnostic
                            Gartner           Descriptice        Analytics
                                               Analytics
                                                                                Analyze

                                              Inform
                                                                                     Effort
Unrestricted © Siemens AG 2019
Page 4                                                                                                     Dr. Jochen Bönig | DF FA MF OPS&C
Predictive Quality in Electronics Manufacturing - Industrial Data ...
CRISP-DM1 as the preferred approach for our
advanced data analytics projects

                                           Business/
                                                                            Data
                                            Process
                                                                        Understanding
                                         Understanding

                                                                                    Data
To get the best results                                                          Preparation
make sure to include
                                    Deployment
process domain know-
                                                         Big Data
how!                                                                               Modeling

                                                         Evaluation

                                                         1 CRISP-DM:   Cross Industry Standard Process for Data Mining
Unrestricted © Siemens AG 2019
Page 5                                                                               Dr. Jochen Bönig | DF FA MF OPS&C
Predictive Quality in Electronics Manufacturing - Industrial Data ...
„Predictive Analytics
requires both domain
and scientific know
how!“
Predictive Quality in Electronics Manufacturing - Industrial Data ...
A digital factory needs an analytics eco system

   Training data                 Data lake
                                                          Continuous Model
                                                            Development         Algorithm performance

                                                                                                 Process refeed

                                              Enrich
                                  Enrich

                                                                 Deploy
   Streaming data                          Real time model execution

                                                                             Algorithm results

Unrestricted © Siemens AG 2019
Page 7                                                                                           Dr. Jochen Bönig | DF FA MF OPS&C
Predictive Quality in Electronics Manufacturing - Industrial Data ...
„One of the biggest
challenges is to build
up an analytics eco
system!“
Predictive Quality in Electronics Manufacturing - Industrial Data ...
Actual EWA IT-architecture already covers a large portion of
desired Lean Digital Factory blueprint
         Management

                                                      BI-Software,                                                                                                Manufacturing
                                                      Analytics & AI                                                                                              Data Platform

         Product Lifecycle Management and ERP

                       NX/                    Teamcenter                    Teamcenter                             ERP
                       Tecnomatix                                           Manufacturing
                                       ~460 Clients              ~70 Clients
         Operations

                                                                                                                                                                      MindSphere
                                                                                                                           Edge App
                                                                                                                                      Edge App
                    SIMATIC IT                  SIMATIC                Energy                     Scout QM                                          SIMATIC
                                                WinCC                  Analytics                                                                    Edge
     ~1.300 Clients                                        ~100 Clients                 ~1.000 Clients                                               16 Clients
         Control
            rol

                  SIMATIC                 SIMATIC            SIMOTION                 SINUMERIK                  SIMATIC                            SCALANCE
                  Controller              HMI                                                                    IPC
                                                                               20 Clients                ~650 Clients          ~250 Clients
         Field                      ~2.800 Clients

                  SIMATIC                    SINAMICS                     SIMATIC                        SITOP                                   SIRIUS
                  Distributed I/O                                         Ident

Unrestricted © Siemens AG 2019
Page 9                                                                                                                                                            Dr. Jochen Bönig | DF FA MF OPS&C
Predictive Quality in Electronics Manufacturing - Industrial Data ...
An edge-based system combines the benefits of a pure local
and pure cloud solution
                Edge solution                                  Cloud solution                                  Edge-Cloud solution
    Cloud

                                                                                            Data preparation      Cloud Cockpit                  Model Dev
                                                                  Cloud Cockpit
                                                                                              + Model Dev

                                                                          Feedback                                                  Compressed                New
                                                                                                                                       data                  models

    Edge

                   Local Cockpit            Data preparation                                                      Local Cockpit              Data praparation
                                              + Model Dev                                                                                    + Model Runtime
                          Feedback

    Field                                                                                                                  Feedback
                                            Raw data                                        Raw data                                         Raw data
                                             upload                                          upload                                           upload

                                     Data connector                                  Data connector                                   Data connector

                  Production asset                               Production asset                                Production asset
                                           1 Client                                                                                       15 Clients

Unrestricted © Siemens AG 2019
Page 10                                                                                                                               Dr. Jochen Bönig | DF FA MF OPS&C
Hot topics for advanced data analytics in manufacturing
  environment

                                                               Manufacturing

“How to improve quality                                     “How to increase uptime                                  “How to improve
level while reducing test                                      while minimizing                                   collaboration while
        effort?”                                              maintenance costs?”                             reducing communication?”
                                   “How to achieve one-piece-                             “How to stabilize
                                     flow while maximizing                            processes while lowering
                                          utilization?”                                    control effort?”
                                                                                                                          Supplier
                                                                                                                        collaboration

  Unrestricted © Siemens AG 2019
  Page 11                                                                                                   Dr. Jochen Bönig | DF FA MF OPS&C
Three use cases for advanced data analytics in
 manufacturing

                                          Manufacturing
“How to improve our quality       “How to achieve one-piece-   “How to increase machine
level while reducing our test       flow while increasing        uptime while reducing
           effort?”                 machine utilization?”        maintenance costs?”

 Unrestricted © Siemens AG 2019
 Page 12                                                                 Dr. Jochen Bönig | DF FA MF OPS&C
Advanced data analytics reduces test effort significantly

                                                                          Today:

                                                             X-Ray
                                                                             SMT                 100%                X-Ray
                                                            (test step)
                                               SMT

                                                                          Future:

                                                                             SMT                 < 50%               X-Ray
                                                        +

    Objective: Connector PCB1 of a   Problem: X-Ray test is a time and    Target: Evaluate quality prediction
            distributed I/O              cost intensive work step          model to reduce X-Ray test effort

                                                                                    1 PCB:   Printed Circuit Board

Unrestricted © Siemens AG 2019
Page 13                                                                                       Dr. Jochen Bönig | DF FA MF OPS&C
Inspection data and X-Ray test data are used to create a
 prediction model for product quality

                                                                                                              X-Ray test protocols

                                                                                                                             10
              Solder paste inspection                                                                                        01
                                                                                                                             01
                                                                                                                             11
                                                                                                                             00
                          10                                                                                                 10
                          01
                          01
                          11
                          00
                          10

                                                                                                                       Offline

                                                                           Reflow soldering                       X-Ray Testing

                                             SMD placement

                 Soldering paste print

Model inputs: 52Mio datasets with very high Process Quality of 7dpm1
Model requirements: Optimize test slip (Bad products are labled as good)

                                                                                              1 dpm:   Defects per million
 Unrestricted © Siemens AG 2019
 Page 14                                                                                               Dr. Jochen Bönig | DF FA MF OPS&C
X-Ray testing effort can be reduced from 100%
 to at least 70%

                                                                                               Model pseudo-
Next steps                                                                                         error
• Further data                                                                   True result
  model validation                    Slip-optimized model
                                                                       n.i.O.                    i.O.
• Adapt algorithm to
                                                         n.i.O.            135               18373464
  new product
                                     Prediction
                                                             i.O.
• Implement                                                                0                   8378038

  automatic data                          Class Recall                     1.0                 31,32%
  collection and
  prediction model                                                  Slip               less x-Ray tests
                                                                                           needed!

 Unrestricted © Siemens AG 2019
 Page 15                                                                          Dr. Jochen Bönig | DF FA MF OPS&C
Most common error types in base unit production detected
by X-Ray testing

                           Part orientation X1                                              18%
               Shield pin not soldered X1                                             17%
               Shield pin not soldered X2                                 14%
          Defective part manufacturer X2                            13%
               Signal pin not soldered X1                     10%    X-Ray of X1 Connector
      Part orientation manufacturer X2                   5%
               Signal pin not soldered X2                5%
                           Part orientation X2      4%
   Defective solder joint signal pin X1            3%
                                 Solder brige X1   3%

Unrestricted © Siemens AG 2019
Page 16                                                                    Dr. Jochen Bönig | DF FA MF OPS&C
The X-Ray system setup according to our analytics
eco-system

                                                             Model                                             Enrich
                                  Enrich
                                                          development

                                                                                       Algorithm performance
                                                              Deploy

                              Solder paste
                                                         Real time model
                            inspection data
                                                           execution
                                                                             Defect?
                                                                                                               yes
                                                                                                                        X-Ray Testing
                                                                                 No defect
                                                                           No testing!
                                           SMT process

Unrestricted © Siemens AG 2019
Page 17                                                                                                           Dr. Jochen Bönig | DF FA MF OPS&C
The panel for SMT production consists of 48 boards and is
double-sided assembled
   48       47       46          45   44   43   42   41   Bottom – connector X2
   40       39       38          37   36   35   34   33   48     Boards per panel

   32       31       30          29   28   27   26   25   52     Pins per board_X2
                                                          2496   Pins per panel_X2
   24       23       22          21   20   19   18   17
                                                          8      Field of views
   16       15       14          13   12   11   10   09
   08       07       06          05   04   03   02   01

   41       42       43          44   45   46   47   48   Top – connector X1
   33       34       35          36   37   38   3    40   48     Boards per panel

   25       26       27          28   29   30   31   32   79     Pins per board_X1
                                                          3792   Pins per panel_X1
   17       18       19          20   21   22   23   24
                                                          8      Field of views
   09       10       11          12   13   14   15   16
   01       02       03          04   05   06   07   08
Unrestricted © Siemens AG 2019
Page 18                                                                              Dr. Jochen Bönig | DF FA MF OPS&C
Alternative routing of the printed circuit board depending on
   the label of the algorithm

    Scenario 1)                 All boards of the panel are predicted as good quality
    Scenario 2)                 All boards of the panel are predicted as poor quality
    Scenario 3)                 Some boards of the panel are predicted as good / poor quality

    Edge                                                                                          Cloud
                                                  X-Ray                                  Non-time-critical level
Time-critical level
                                                 (Offline)

                                                                                                              Algorithm training

                                                                                                                        10
                                                                                                                   10   01   10
                                                                                                                             01   10
                                                                                                                   01   01        01
                                                                                                                   01   11   01
                                                                                                                             11   01
                                                                                                                   11   01        11
                                                                                                                   01   11   01
                                                                                                                             11   01
                                                                                                                   11   01        11
                                                                                                                   01   00   01
                                                                                                                             00   01
                                                                                                                   00             00
                                                                                                                             10
                                                                                                                             01
                                      10                                                                                     01
                                      01                                   Time series                                       11
                                      01                                                                                     01
                                      11                                      data                                           11
                                                                                                                             01
                                                                                                                             00
                                                               optimized
                                                               algorithm
   Unrestricted © Siemens AG 2019
   Page 19                                                                                                    Dr. Jochen Bönig | DF FA MF OPS&C
Dynamic X-Ray testing enables additional productivity

                                   20%                       80%
                                                                                               Process time
                                 Handling                Testing time
                                                                                         100
                                                                                         80
                                                                                         %
                                                                                         60
                                                                                         40
                                                                                         20
                                 Handling            Testing time             FOV skip    0

                                                                                               Handling     Testing

                                      Unit
                                    forecast
                                               Process
                                                 time
                                                              Time/FOV                               € /a      € /a      € /a

                                                                         Costs/FOV
                                                                                                     € /a

Unrestricted © Siemens AG 2019
Page 20                                                                                        Dr. Jochen Bönig | DF FA MF OPS&C
AI minimizes               While maintaining the   Resulting in reduced
necessary X-RAY            high Quality rate of    capital invest for
tests by currently 30%                             further X-RAY
                                                   machines of
Target for the future is

100% 100% 500k€
Thank you for your
   attention
Unrestricted © Siemens AG 2019
You can also read